Generic Article on Atomic Force Microscope (AFM)

An Atomic Force Microscope (AFM) is a high-resolution imaging instrument widely used in nanotechnology, materials science, life sciences, and semiconductor research. It allows scientists to visualize, measure, and manipulate matter at the nanoscale by using a mechanical probing method rather than optical or electron-based imaging. Its ability to generate three-dimensional surface profiles with atomic-level precision has made AFM one of the most powerful tools for nanoscale characterization.

Introduction to AFM Technology

The AFM was invented in the mid-1980s as an extension of the Scanning Tunneling Microscope (STM). Unlike STM, which requires conductive samples, AFM can analyze almost any type of surface—conductive, non-conductive, biological, or polymeric. The key component of an AFM is its sharp probe, or cantilever tip, which interacts physically with the sample surface. As the tip moves across the surface, it experiences forces such as van der Waals attraction, electrostatic repulsion,…